Analysis And Design Of Digital Integrated Circuits In Deep Submicron Technology Pdf

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Analysis and design of digital integrated circuits : in deep submicron technology

Skip to search form Skip to main content You are currently offline. Some features of the site may not work correctly. Hodges and Horace G. Jackson and R. Hodges , Horace G.

Skip to Main Content. A not-for-profit organization, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity. Use of this web site signifies your agreement to the terms and conditions. Static noise analysis for digital integrated circuits in partially depleted silicon-on-insulator technology Abstract: This paper extends transistor-level static noise analysis to consider the unique features of partially depleted silicon-on-insulator PD-SOI technology: floating-body-induced threshold voltage variations and parasitic bipolar leakage currents. Based on this picture, a simple model of the body voltage is derived which takes into account modest knowledge of which nets have dependable regular switching activity. Results are presented using a commercial static noise analysis tool incorporating these extensions and comparisons are made with SPICE.

Enter your mobile number or email address below and we'll send you a link to download the free Kindle App. Then you can start reading Kindle books on your smartphone, tablet, or computer - no Kindle device required. The third edition of Hodges and Jackson's Analysis and Design of Digital Integrated Circuits has been thoroughly revised and updated by new co-author Resve Saleh of the University of British Columbia, This new edition combines the approachability and concision of the Hodges and Jackson classic with completely updated content, bringing the book firmly into the twenty-first century. The new edition exemplifies the extensive changes in the integrated circuit IC industry since publication of the second edition 15 years ago, particularly the developement of complementry metal-oxide-semiconductor cmos as the dominant IC technology. The focus of this latest edition is unmistakably on the latest CMOS technologies 0.

Analysis And Design Of Digital Integrated Circuits.

Abstract—As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of very large scale integrated VLSI systems. A metric for noise immunity is defined, and a static noise analysis methodology based on this noise-stability metric is introduced to demonstrate how noise can be analyzed systematically on a full-chip basis using simulationbased transistor-level analysis. We then describe Harmony, a two-level macro and global hierarchical implementation of static noise analysis. At the macro level, simplified interconnect models and timing assumptions guide efficient analysis. The global level involves a careful combination of static noise analysis, static timing analysis, and detailed interconnect macromodels based on reduced-order modeling techniques.

For readers interested in digital circuit design. The reason is the electronic devices divert your attention and also cause strains while reading eBooks. Since the publication of the first edition of this book in , CMOS manufacturing technology has continued its breathtaking pace, scaling to ever-smaller dimensions. Minimum feature sizes are now reaching the rim realm. Circuits are becoming more complex, challenging the productivity of the designer, while the plunge into the deep-submicron space causes devices to behave differently and brings to the forefront a number of new issues that impact the reliability, cost, performance, power dissipation, and reliability of the digital IC.

Analysis And Design Of Digital Integrated Circuits.

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